Transient nature of negative capacitance in ferroelectric field-effect transistors

Kwok K. Ng, S.J. Hillenius, Alexei Gruverman

Type: Article

Publication Date: 2017-07-29

Citations: 26

DOI: https://doi.org/10.1016/j.ssc.2017.07.020

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Solid State Communications - View - PDF

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