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100-Fold Reduction of Electric-Field Noise in an Ion Trap Cleaned with<i>In Situ</i>Argon-Ion-Beam Bombardment
Motional heating of trapped atomic ions is a major obstacle to their use as quantum bits in a scalable quantum computer. The detailed physical origin of this heating is not well understood, but experimental evidence suggests that it is caused by electric-field noise emanating from the surface of the trap …