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Separating edges from microstructure in X-ray dark-field imaging: Evolving and devolving perspectives via the X-ray Fokker-Planck equation
A key contribution to X-ray dark-field (XDF) is X-ray diffusion by sample structures smaller than the imaging system's spatial resolution. However, some XDF techniques report that resolvable sample edges also generate XDF. Speckle-based X-ray imaging (SBXI) extracts XDF by analyzing sample-imposed changes to a reference speckle pattern's visibility. We present …