BEACON -- Automated Aberration Correction for Scanning Transmission
Electron Microscopy using Bayesian Optimization
BEACON -- Automated Aberration Correction for Scanning Transmission
Electron Microscopy using Bayesian Optimization
Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without interrupting on-going experiments. Here, we present an automated method of correcting first- and second-order aberrations called BEACON which uses Bayesian …