Real-space tilting method for atomic resolution STEM imaging of
nanocrystalline materials
Real-space tilting method for atomic resolution STEM imaging of
nanocrystalline materials
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns. However, for small-sized nanocrystalline materials, their diffraction patterns are too faint to guide the tilting process. Here, a simple and …