Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of …