Defect Contrast with 4D-STEM: Understanding Crystalline Order with Virtual Detectors and Beam Modification
Defect Contrast with 4D-STEM: Understanding Crystalline Order with Virtual Detectors and Beam Modification
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction patterns are acquired at a grid of points on the sample, provides a versatile method for highlighting defects. Computational analysis of …