Hard x-ray photoemission study on strain effect in LaNiO3 thin films
Hard x-ray photoemission study on strain effect in LaNiO3 thin films
The strain effect from a substrate is an important experimental route to control electronic and magnetic properties in transition-metal oxide (TMO) thin films. Using hard x-ray photoemission spectroscopy, we investigate the strain dependence of the valence states in LaNiO3 thin films, strongly correlated perovskite TMO, grown on four substrates: LaAlO3, …