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Resonant Soft X-Ray Scattering from Stripe-Ordered <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:msub><mml:mi>La</mml:mi><mml:mrow><mml:mn>2</mml:mn><mml:mo>โ</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub><mml:msub><mml:mi>Ba</mml:mi><mml:mi>x</mml:mi></mml:msub><mml:msub><mml:mrow><mml:mi>Cu</mml:mi><mml:mi mathvariant="normal">O</mml:mi></mml:mrow><mml:mn>4</mml:mn></mml:msub></mml:math> Detected by a Transition-Edge Sensor Array Detector
Resonant soft x-ray scattering (RSXS) is a leading probe of valence-band order in materials best known for detecting charge-density-wave order in copper-oxide superconductors. One of the biggest limitations on the RSXS technique is the presence of a severe fluorescence background, which, like the RSXS cross section itself, is enhanced under โฆ