General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers
General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers
Toroidally and spherically bent single crystals are widely employed as optical elements in hard X-ray spectrometry at synchrotron and free-electron laser light sources, and in laboratory-scale instruments. To achieve optimal spectrometer performance, a solid theoretical understanding of the diffraction properties of such crystals is essential. In this work, a general …