Flexible focal plane arrays for UVOIR wide field instrumentation
Flexible focal plane arrays for UVOIR wide field instrumentation
LAM and CEA-LETI are developing the technology of deformable detectors, for UV, VIS or NIR applications. Such breakthrough devices will be a revolution for future wide field imagers and spectrographs, firstly by improving the image quality with better off-axis sharpness, resolution, brightness while scaling down the optical system, secondly by …