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Intrinsic noise of a micromechanical displacement detector based on the radio-frequency single-electron transistor
We investigate the intrinsic noise of a micromechanical displacement detector based on the radio-frequency single-electron transistor (rf-SET). Using the noise analysis of a SET by Korotkov [Phy. Rev. B 49, 10381 (1994)] as our starting point, we determine the spectral density of the displacement noise due to the tunneling current …