Dielectric losses in multi-layer Josephson junction qubits
Dielectric losses in multi-layer Josephson junction qubits
We have measured the excited state lifetimes in Josephson junction phase and transmon qubits, all of which were fabricated with the same scalable multi-layer process. We have compared the lifetimes of phase qubits before and after removal of the isolating dielectric, SiNx, and find a fourfold improvement of the relaxation …