Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance
Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance
Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance values in the picometer range, with enormous impact on potential scientific applications. Here we present a new characterization method …