Multivariate Statistical Analysis of Spectrum Lines From Si<sub>3</sub>N<sub>4</sub> Grain Boundaries
Multivariate Statistical Analysis of Spectrum Lines From Si<sub>3</sub>N<sub>4</sub> Grain Boundaries
Abstract It is well known that the high-temperature properties of polycrystalline Si3N4 ceramics are strongly influenced by the nanometer-scale glassy phase at the grain boundaries. We have recently analyzed the variation of the near-edge fine structure (ELNES) of the Si-L2,3 edges using a combination of TEM spectrum-line acquisition with an …