Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements
Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements
Surface electric noise, i.e., the nonuniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different experimental circumstances. The scientists employing atomic force microscopy (AFM) have long focused their efforts to understand …