Geometric distortion calibration with photolithographic pinhole masks for high-precision astrometry
Geometric distortion calibration with photolithographic pinhole masks for high-precision astrometry
Adaptive optics (AO) systems deliver high-resolution images that may be ideal for precisely measuring positions of stars (i.e., astrometry) if the system has stable and well-calibrated geometric optical distortions. A calibration unit equipped with a back-illuminated pinhole mask can be utilized to measure instrumental optical distortions. AO systems on the …