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Electrical characterization of PbZr0.4Ti0.6O3 capacitors
We have conducted a careful study of current-voltage (I-V) characteristics in fully integrated commercial PbZr0.4Ti0.6O3 thin-film capacitors with Pt bottom and IrāIrO2 top electrodes. Highly reproducible steady-state I-V were obtained at various temperatures over two decades in voltage from current-time data and analyzed in terms of several common transport models ā¦