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Characteristics of long-lived persistent spectral holes in <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msup><mml:mrow><mml:mi>Eu</mml:mi></mml:mrow><mml:mrow><mml:mn>3</mml:mn><mml:mo>+</mml:mo></mml:mrow></mml:msup></mml:math> : <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:msub><mml:mi mathvariant="normal">Y</mml:mi><mml:mn>2</mml:mn></mml:msub><mml:msub><mml:mi>SiO</mml:mi><mml:mn>5</mml:mn></mml:msub></mml:mrow></mml:math> at 1.2 K
Properties of persistent spectral holes (SHs) relevant for frequency metrology have been investigated in the system $Eu^{3+}:Y_{2}SiO_{5}$ (0.5%) at crystallographic site 1 and a temperature of $1.2$ Kelvin. Hole linewidths as small as $0.6~kHz$ have been reliably achieved. The theoretically predicted $T^4$-dependence of the frequency shift with temperature has been …