Observation of superconductivity and surface noise using a single trapped ion as a field probe
Observation of superconductivity and surface noise using a single trapped ion as a field probe
Measuring and understanding electric-field noise from bulk material and surfaces is important for many areas of physics. In this work, we demonstrate the probing of electric-field noise from different sources with an ion, $225\phantom{\rule{4pt}{0ex}}\ensuremath{\mu}\mathrm{m}$ above the trap surface. We detect noise levels as small as ${S}_{E}=5.2(11)\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}16}\phantom{\rule{4pt}{0ex}}{\mathrm{V}}^{2}\phantom{\rule{0.16em}{0ex}}{\mathrm{m}}^{\ensuremath{-}2}\phantom{\rule{0.16em}{0ex}}{\mathrm{Hz}}^{\ensuremath{-}1}$ at ${\ensuremath{\omega}}_{\text{z}}=2\ensuremath{\pi}\ifmmode\times\else\texttimes\fi{}1.51\phantom{\rule{4pt}{0ex}}\mathrm{MHz}$ and $T=12\phantom{\rule{4pt}{0ex}}\mathrm{K}$. …