An open-source platform to study uniaxial stress effects on nanoscale devices
An open-source platform to study uniaxial stress effects on nanoscale devices
We present an automatic measurement platform that enables the characterization of nanodevices by electrical transport and optical spectroscopy as a function of the uniaxial stress. We provide insights into and detailed descriptions of the mechanical device, the substrate design and fabrication, and the instrument control software, which is provided under …