Determination of constitutive and morphological parameters of columnar thin films by inverse homogenization
Determination of constitutive and morphological parameters of columnar thin films by inverse homogenization
A dielectric columnar thin film (CTF), characterized macroscopically by a relative permittivity dyadic, was investigated theoretically. The CTF was assumed, on the nanoscale, to be an assembly of parallel, identical, elongated ellipsoidal inclusions made of an isotropic dielectric material that has a different refractive index from the bulk material that …