Using Profile Monitoring Techniques for a Data‐rich Environment with Huge Sample Size
Using Profile Monitoring Techniques for a Data‐rich Environment with Huge Sample Size
Abstract In‐process sensors with huge sample size are becoming popular in the modern manufacturing industry, due to the increasing complexity of processes and products and the availability of advanced sensing technology. Under such a data‐rich environment, a sample with huge size usually violates the assumption of homogeneity and degrades the …