Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images
Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images
Abstract The discrete Fourier transform is among the most routine tools used in high-resolution scanning/transmission electron microscopy (S/TEM). However, when calculating a Fourier transform, periodic boundary conditions are imposed and sharp discontinuities between the edges of an image cause a cross patterned artifact along the reciprocal space axes. This artifact …