Semiparametric accelerated failure time model for length-biased data with application to dementia study
Semiparametric accelerated failure time model for length-biased data with application to dementia study
A semiparametric accelerated failure time (AFT) model is proposed to evaluate the effects of risk factors on the unbiased failure times for the target population given the observed length-biased data. The analysis of length-biased data is complicated by informative right censoring due to the biased sampling mechanism, and consequently the …