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Depairing currents in superconducting films of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Nb</mml:mi></mml:mrow></mml:math>and amorphous<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">MoGe</mml:mi></mml:mrow></mml:math>

Depairing currents in superconducting films of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Nb</mml:mi></mml:mrow></mml:math>and amorphous<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">MoGe</mml:mi></mml:mrow></mml:math>

We report on measuring the depairing current ${J}_{\mathrm{dp}}$ in thin superconducting films as a function of temperature. The main difficulties in such measurements are that heating has to be avoided, either due to contacts, or to vortex flow. The latter is almost unavoidable since the sample cross section is usually …