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Effective gap at microwave frequencies in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Mg</mml:mi><mml:msub><mml:mi mathvariant="normal">B</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>thin films with strong interband scattering

Effective gap at microwave frequencies in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Mg</mml:mi><mml:msub><mml:mi mathvariant="normal">B</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>thin films with strong interband scattering

The microwave properties of polycrystalline $\mathrm{Mg}{\mathrm{B}}_{2}$ thin films prepared by the so-called in situ method are investigated. The characterization of the films at microwave frequencies was obtained by a coplanar resonator technique. The analysis of the experimental data results in the determination of penetration depth, surface impedance, and complex conductivity. …