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Rotational disorder in few-layer graphene films on<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mn>6</mml:mn><mml:mi>H</mml:mi><mml:mtext>−</mml:mtext><mml:mi mathvariant="normal">Si</mml:mi><mml:mi mathvariant="normal">C</mml:mi><mml:mrow><mml:mo>(</mml:mo><mml:mn>000</mml:mn><mml:mtext>−</mml:mtext><mml:mn>1</mml:mn><mml:mo>)</mml:mo></mml:mrow></mml:mrow></mml:math>: A scanning tunneling microscopy study
We have analyzed by using scanning tunneling microscopy (STM) thin films made of few (three to five) graphene layers grown on the C terminated face of $6H\text{\ensuremath{-}}\mathrm{Si}\mathrm{C}$ in order to identify the nature of the azimuthal disorder reported in this material. We observe superstructures which are interpreted as Moir\'e patterns …