Charge noise in single-electron transistors and charge qubits may be caused by metallic grains
Charge noise in single-electron transistors and charge qubits may be caused by metallic grains
We report on measurements of low-frequency noise in a single-electron transistor (SET) from a few hertz up to 10 MHz. Measurements were done for different bias and gate voltages, which allow us to separate noise contributions from different noise sources. We find a $1/f$ noise spectrum with two Lorentzians superimposed. …