Electronic structure of boron and aluminum <i>δ</i>-doped layers in silicon

Quinn Campbell, Shashank Misra, Andrew Baczewski

Type: Article

Publication Date: 2023-07-25

Citations: 1

DOI: https://doi.org/10.1063/5.0156832

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Locations

Journal of Applied Physics - View
arXiv (Cornell University) - View - PDF
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) - View

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