Demonstrating scalable randomized benchmarking of universal gate sets

Type: Preprint

Publication Date: 2022-01-01

Citations: 4

DOI: https://doi.org/10.48550/arxiv.2207.07272

Locations

  • eScholarship (California Digital Library) - View - PDF
  • arXiv (Cornell University) - View - PDF
  • OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) - View
  • DataCite API - View

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+ PDF Chat Superconducting quantum circuits at the surface code threshold for fault tolerance 2014 R. Barends
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