Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs

Fabio Acerbi, Stefano Davini, Alessandro Ferri, C. Galbiati, Graham K. Giovanetti, A. Gola, George Korga, Andrea Mandarano, M. Marcante, G. Paternoster

Type: Article

Publication Date: 2017-01-05

Citations: 58

DOI: https://doi.org/10.1109/ted.2016.2641586

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IEEE Transactions on Electron Devices - View
arXiv (Cornell University) - View - PDF
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